Electrical / electromagnetic metrology

News and Updates

NIST, Collaborators Develop Sensitive New Way of Detecting Transistor Defects

October 7, 2021

Researchers at the National Institute of Standards and Technology (NIST) and collaborators have devised and tested a new, highly sensitive method of detecting

Quantum Matchmaking: New NIST System Detects Ultra-Faint Communications Signals Using the Principles of Quantum Physics

September 23, 2020

Researchers at the National Institute of Standards and Technology (NIST) have devised and demonstrated a system that could dramatically increase the performance

Atomic ‘Swiss Army Knife’ Precisely Measures Materials for Quantum Computers

July 6, 2020

It images single atoms. It maps atomic-scale hills and valleys on metal and insulating surfaces. And it records the flow of current across atom-thin materials

Projects and Programs

Electric-acoustic spectroscopy for intermolecular interactions in solution

NIST’s Material Measurement Laboratory and Communications Technology Laboratory are developing a new spectroscopy for intermolecular interactions. The team is

Small array of transistors designed for single device integration.

Integrated CMOS Testbeds for Nanoelectronics and Machine Learning

With the rapid rise of artificial intelligence and its insatiable demand for low-energy, high performance computing, research is accelerating into novel

Quantum Voltage Project

Goal: To develop Josephson voltage standard (JVS) systems to improve the dissemination of primary standards and the accuracy of voltage measurements from DC to

Single Photonics and Quantum Information

The smallest unit of light is a "photon". Generation, manipulation and measurement of light at or near the fundamental limit of a photon can enhance the

Publications

Evaluating solder joint failures and solder joint reliability: A side-by-side comparison of Direct Current and Microwave Based Monitoring Techniques

August 23, 2021

Author(s)

Yaw S. Obeng, Papa Amoah

Historically, the evaluating solder joint failures and solder joint reliability have been done with DC methods using event detectors or data loggers for high

Graphene quantum Hall effect devices for ac and dc electrical metrology

June 4, 2021

Author(s)

Mattias Kruskopf, Stephan Bauer, Yaowaret Pimsut, Atasi Chatterjee, Dinesh Patel, Albert Rigosi, Randolph Elmquist, Klaus Pierz, Eckart Pesel, Martin Goetz, Juergen Schurr

Decision Tree for Key Comparisons

April 27, 2021

Author(s)

Antonio Possolo, Amanda Koepke, David Newton, Michael R. Winchester

This contribution describes a Decision Tree intended to guide the selection of statistical models and data reduction procedures in key comparisons (KCs). The

Evaluations of a Detector-Limited Digital Impedance Bridge

April 6, 2021

Author(s)

Mona Feige, Stephan Schlamminger, Yicheng Wang

We tested a simple digital impedance bridge using two nominally equal resistors to form a 1:1 ratio. We focused on resolution and stability of the detectors

Tools and Instruments

Molecular Beam Epitaxy (MBE) Facility

The Applied Physics Division utilizes a fully automated, dual-chamber molecular beam epitaxy (MBE) system for the growth of advanced, compound semiconductor

Apparatus for the Measurement of High Temperature Thermoelectric Transport Properties

The Seebeck coefficient is a physical parameter routinely measured to identify the potential thermoelectric performance of a material. However, researchers

High Throughput (Combinatorial) Screening Tool for Characterization of Thin Film Thermoelectrics as a Function Temperature

High-throughput (combinatorial) metrologies have evolved as a useful approach to rapidly determine the composition-structure-property relationships for novel